Repetitive Peak Reverse Voltage : VRRM = 800 V
Average Forward Current : IF(AV) = 10 A
TO-220 SM Package

Single-chip bipolar sinusoidal micro-step stepping motor
driver
Output current up to 1.5 A (AVE.) and 2.5 A (PEAK)
PWM chopper-type
Structured by high voltage Bi-CMOS process technology
Forward and reverse rotation are available
2-, 1-2-, W1-2-, and 2W1-2-phase modes, and one- or two-clock
drives can be selected.
Package: HZIP25-P
Input pull-up resistor equipped with RESET pin: R = 100 kΩ (typ.)
Output monitor available with MO IO ( MO ) = ±2 mA (MAX.)
Equipped with RESET and ENABLE pins.

Plasma display panel
High Speed Interface
Factory Automation
The TOSHIBA TLP716F consists of an infrared emitting diode and a high
speed photodetector. This unit is 6-lead SDIP. TLP716F is 50% smaller than
8PIN DIP and has suited the safety standard reinforced insulation class.

TOSHIBA TF1204 is the GTR driver designed for use with TOSHIBA Giant Transistor Module and it includes the optical isolator and GTR driver circuit,

Using this driver, you can design high reliability and compact system.

• 2000VRMS OptiGal Isolation
• Logic Compatible Input
• High Speed Switching Response

. tpLH     3ys, tpHL – 4ys (Typ.)

• Small Size and Light Weight

High Speed, High current Switching Applications
Chopper Regulator, DC−DC Converter and Motor Drive
Applications
4-V gate drive
Low drain−source ON resistance : RDS (ON) = 0.55 Ω (typ.)
High forward transfer admittance : |Yfs| = 0.9 S (typ.)
Low leakage current : IDSS = −100 μA (max) (VDS = −60 V)
Enhancement mode : Vth = −0.8 to −2.0 V (VDS = −10 V, ID = −1 mA),

Note 1: Ensure that the channel temperature does not exceed 150°C.
Note 2: Mounted on a ceramic substrate (25.4 mm × 25.4 mm × 0.8 mm)
Note 3: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability
Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e.
reliability test report and estimated failure rate, etc).